ANALISYSIS OF CHANGES IN INTERNAL RESISTANCE AT REST CONDITIONS USING A PULSE TEST WHIT A 20 OHM RESISTOR LOAD

Authors

  • padilah wanda hasibuan universitas teknologi sumbawa
  • Paris Ali Topan Universitas Teknologi Sumbawa
  • Desi Maulidyawati Universitas Teknologi Sumbawa
  • Masyitah Aulia Universitas Teknologi Sumbawa

DOI:

https://doi.org/10.51401/altron.v2i02.3301

Keywords:

Pulse Test, Li-Po Battery, 20 ohm Resistor

Abstract

 The pulse test is a testing technique used to measure the internal resistance of a material, the rest condition refers to a state that has undergone a process that produces the stress present in the material. The pulse test method is used on a 20 ohm load resistor subjected to a rest condition to test changes in internal resistance in the material. The test is carried out by giving repeated electric boosts to the resistor load, and during the test the internal resistance fluctuates and is measured and analyzed. The results of the analysis show that the pulse test at rest conditions is able to provide information on the residual stress in the material and to find out the problems that exist in the structure of the components in the material. This study provides insight into the quality and strength of materials in rest conditions and assists in process improvement which makes processing to avoid problems occurring in resistance channels and pulse tests useful in evaluating the efficient yield of materials. In conclusion, the analysis of changes in internal resistance at rest conditions uses a pulse test with a 20 ohm resistor load. To find out the residual stress and understand the quality and strength of the material that has been produced. This research has the capacity to assist in the development of more sophisticated resistance techniques and improve the safety and quality of components using resistance joints

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Published

2023-08-09

How to Cite

hasibuan, padilah wanda, Topan, P. A., Maulidyawati, D., & Aulia, M. (2023). ANALISYSIS OF CHANGES IN INTERNAL RESISTANCE AT REST CONDITIONS USING A PULSE TEST WHIT A 20 OHM RESISTOR LOAD. Journal Altron; Journal of Electronics, Science & Energy Systems, 2(02), 121-129. https://doi.org/10.51401/altron.v2i02.3301

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